Metal Impurities in Silicon- and Germanium-Based Technologies

Origin, Characterization, Control, and Device Impact

Nonfiction, Science & Nature, Technology, Microwaves, Material Science
Cover of the book Metal Impurities in Silicon- and Germanium-Based Technologies by Cor Claeys, Eddy Simoen, Springer International Publishing
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Author: Cor Claeys, Eddy Simoen ISBN: 9783319939254
Publisher: Springer International Publishing Publication: August 13, 2018
Imprint: Springer Language: English
Author: Cor Claeys, Eddy Simoen
ISBN: 9783319939254
Publisher: Springer International Publishing
Publication: August 13, 2018
Imprint: Springer
Language: English

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed.

 

The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices’ performance. Several control and possible gettering approaches are addressed.

 

The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

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