Wireless Security: Know It All

Nonfiction, Science & Nature, Technology, Telecommunications, Engineering
Cover of the book Wireless Security: Know It All by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra, Elsevier Science
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra ISBN: 9780080949673
Publisher: Elsevier Science Publication: April 19, 2011
Imprint: Newnes Language: English
Author: Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
ISBN: 9780080949673
Publisher: Elsevier Science
Publication: April 19, 2011
Imprint: Newnes
Language: English

The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf!

Communications engineers need to master a wide area of topics to excel. The Wireless Security Know It All covers every angle including Emerging Wireless Technologies and Security Issues, Wireless LAN and MAN Security, as well as Wireless Personal Area Networks.

• A 360-degree view from our best-selling authors
• Topics include Today’s Wireless Technology, Security Definitions and Concepts, and Wireless Handheld devices
• The ultimate hard-working desk reference; all the essential information, techniques and tricks of the trade in one volume

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf!

Communications engineers need to master a wide area of topics to excel. The Wireless Security Know It All covers every angle including Emerging Wireless Technologies and Security Issues, Wireless LAN and MAN Security, as well as Wireless Personal Area Networks.

• A 360-degree view from our best-selling authors
• Topics include Today’s Wireless Technology, Security Definitions and Concepts, and Wireless Handheld devices
• The ultimate hard-working desk reference; all the essential information, techniques and tricks of the trade in one volume

More books from Elsevier Science

Cover of the book Defect Structure and Properties of Nanomaterials by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Bubbles in Food 2 by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Luminescence and the Solid State by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Experiment and Calculation of Reinforced Concrete at Elevated Temperatures by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Advances in Agronomy by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Parallel Computational Fluid Dynamics 2006 by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Neurobiology of Abnormal Emotion and Motivated Behaviors by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Materials and Surface Engineering by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Alternative Energy Sources by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Fluorine and Health by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Biophysical, Chemical, and Functional Probes of RNA Structure, Interactions and Folding: Part B by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Advances in the Study of Behavior by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Creep and Fatigue in Polymer Matrix Composites by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Pile Design and Construction Rules of Thumb by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
Cover of the book Nonlinear Magnetization Dynamics in Nanosystems by Jon S. Wilson, John Rittinghouse, PhD, CISM, Timothy Stapko, James F. Ransome, PhD, CISM, CISSP, Dan Bensky, Frank Thornton, Tony Bradley, Chris Hurley, Chris Lanthem, George L Stefanek, Stephen A. Rackley, Praphul Chandra
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy