Protecting Chips Against Hold Time Violations Due to Variability

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Advanced Computing, Engineering, Computer Architecture
Cover of the book Protecting Chips Against Hold Time Violations Due to Variability by Gustavo Neuberger, Gilson Wirth, Ricardo Reis, Springer Netherlands
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Gustavo Neuberger, Gilson Wirth, Ricardo Reis ISBN: 9789400724273
Publisher: Springer Netherlands Publication: October 1, 2013
Imprint: Springer Language: English
Author: Gustavo Neuberger, Gilson Wirth, Ricardo Reis
ISBN: 9789400724273
Publisher: Springer Netherlands
Publication: October 1, 2013
Imprint: Springer
Language: English

With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasingly important and is a very important issue in the design of complex circuits. Process variability is the statistical variation of process parameters, meaning that these parameters do not have always the same value, but become a random variable, with a given mean value and standard deviation. This effect can lead to several issues in digital circuit design.

The logical consequence of this parameter variation is that circuit characteristics, as delay and power, also become random variables. Because of the delay variability, not all circuits will now have the same performance, but some will be faster and some slower. However, the slowest circuits may be so slow that they will not be appropriate for sale. On the other hand, the fastest circuits that could be sold for a higher price can be very leaky, and also not very appropriate for sale. A main consequence of power variability is that the power consumption of some circuits will be different than expected, reducing reliability, average life expectancy and warranty of products. Sometimes the circuits will not work at all, due to reasons associated with process variations. At the end, these effects result in lower yield and lower profitability.

To understand these effects, it is necessary to study the consequences of variability in several aspects of circuit design, like logic gates, storage elements, clock distribution, and any other that can be affected by process variations. The main focus of this book will be storage elements.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

With the development of Very-Deep Sub-Micron technologies, process variability is becoming increasingly important and is a very important issue in the design of complex circuits. Process variability is the statistical variation of process parameters, meaning that these parameters do not have always the same value, but become a random variable, with a given mean value and standard deviation. This effect can lead to several issues in digital circuit design.

The logical consequence of this parameter variation is that circuit characteristics, as delay and power, also become random variables. Because of the delay variability, not all circuits will now have the same performance, but some will be faster and some slower. However, the slowest circuits may be so slow that they will not be appropriate for sale. On the other hand, the fastest circuits that could be sold for a higher price can be very leaky, and also not very appropriate for sale. A main consequence of power variability is that the power consumption of some circuits will be different than expected, reducing reliability, average life expectancy and warranty of products. Sometimes the circuits will not work at all, due to reasons associated with process variations. At the end, these effects result in lower yield and lower profitability.

To understand these effects, it is necessary to study the consequences of variability in several aspects of circuit design, like logic gates, storage elements, clock distribution, and any other that can be affected by process variations. The main focus of this book will be storage elements.

More books from Springer Netherlands

Cover of the book Critical Perspectives on the Organization and Improvement of Schooling by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Palaeomagnetism by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Jordan: A Study in Political Development (1921–1965) by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book The Basic Approach to Age-Structured Population Dynamics by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Dewey and his Influence by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Prognosis in the Rheumatic Diseases by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book A Critical Study in Method by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Science in Flux by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Multiple Risk Factors in Cardiovascular Disease by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Test Policy in Defense by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Offshore Site Investigation by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Erich Hückel (1896-1980) by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Aquatic Telemetry by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Law, Ideology and Punishment by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
Cover of the book Climate in Human Perspective by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy