Focused Ion Beam Systems

Basics and Applications

Nonfiction, Science & Nature, Technology, Material Science, Engineering, Mechanical
Cover of the book Focused Ion Beam Systems by , Cambridge University Press
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: ISBN: 9781139810104
Publisher: Cambridge University Press Publication: September 13, 2007
Imprint: Cambridge University Press Language: English
Author:
ISBN: 9781139810104
Publisher: Cambridge University Press
Publication: September 13, 2007
Imprint: Cambridge University Press
Language: English

The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

More books from Cambridge University Press

Cover of the book The Cambridge Companion to Ralph Waldo Emerson by
Cover of the book Biotic Evolution and Environmental Change in Southeast Asia by
Cover of the book Sentencing and Criminal Justice by
Cover of the book Freedom in a Slave Society by
Cover of the book The Cambridge Companion to Canadian Literature by
Cover of the book The Shapley Value by
Cover of the book The Cambridge Companion to David Hare by
Cover of the book Heresy, Literature and Politics in Early Modern English Culture by
Cover of the book The Third Industrial Revolution in Global Business by
Cover of the book The President's Legislative Policy Agenda, 1789–2002 by
Cover of the book Civil Society in Europe by
Cover of the book The Comparative Archaeology of Complex Societies by
Cover of the book The Politics of Welfare State Reform in Continental Europe by
Cover of the book The Origins of Yoga and Tantra by
Cover of the book Rethinking Governance by
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy