R F Egerton: 2 books
by R.F. Egerton
Language: English
Release Date: July 29, 2011
Language: English
Release Date: July 29, 2011
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron...
Physical Principles of Electron Microscopy
An Introduction to TEM, SEM, and AEM
Language: English
Release Date: July 1, 2016
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy,...