Greg Haugstad: 1 book

Book cover of Atomic Force Microscopy

Atomic Force Microscopy

Understanding Basic Modes and Advanced Applications

by Greg Haugstad
Language: English
Release Date: September 4, 2012

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical...
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