Test Generation of Crosstalk Delay Faults in VLSI Circuits

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Advanced Computing, Engineering, Computer Architecture
Cover of the book Test Generation of Crosstalk Delay Faults in VLSI Circuits by S. Jayanthy, M.C. Bhuvaneswari, Springer Singapore
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Author: S. Jayanthy, M.C. Bhuvaneswari ISBN: 9789811324932
Publisher: Springer Singapore Publication: September 20, 2018
Imprint: Springer Language: English
Author: S. Jayanthy, M.C. Bhuvaneswari
ISBN: 9789811324932
Publisher: Springer Singapore
Publication: September 20, 2018
Imprint: Springer
Language: English

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

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This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

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