M C Bhuvaneswari: 1 book

Book cover of Test Generation of Crosstalk Delay Faults in VLSI Circuits
by S. Jayanthy, M.C. Bhuvaneswari
Language: English
Release Date: September 20, 2018

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on...
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