Test and Diagnosis for Small-Delay Defects

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Computer Hardware, Input-Output Equipment
Cover of the book Test and Diagnosis for Small-Delay Defects by Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty, Springer New York
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Author: Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty ISBN: 9781441982971
Publisher: Springer New York Publication: September 8, 2011
Imprint: Springer Language: English
Author: Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
ISBN: 9781441982971
Publisher: Springer New York
Publication: September 8, 2011
Imprint: Springer
Language: English

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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