Ke Peng: 2 books

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies...

This book investigates observer-fault estimation techniques in detail, while also highlighting recent research and findings regarding fault estimation. Many practical control systems are subject to possible malfunctions, which may cause significant performance loss or even system instability. To improve...