Knowledge-Driven Board-Level Functional Fault Diagnosis

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Database Management
Cover of the book Knowledge-Driven Board-Level Functional Fault Diagnosis by Zhaobo Zhang, Fangming Ye, Xinli Gu, Krishnendu Chakrabarty, Springer International Publishing
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Author: Zhaobo Zhang, Fangming Ye, Xinli Gu, Krishnendu Chakrabarty ISBN: 9783319402109
Publisher: Springer International Publishing Publication: August 19, 2016
Imprint: Springer Language: English
Author: Zhaobo Zhang, Fangming Ye, Xinli Gu, Krishnendu Chakrabarty
ISBN: 9783319402109
Publisher: Springer International Publishing
Publication: August 19, 2016
Imprint: Springer
Language: English

This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.

• Explains and applies optimized techniques from the machine-learning       domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;

• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;

• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.

• Explains and applies optimized techniques from the machine-learning       domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;

• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;

• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.

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