CMOS RF Circuit Design for Reliability and Variability

Nonfiction, Science & Nature, Technology, Microwaves, Electronics, Circuits
Cover of the book CMOS RF Circuit Design for Reliability and Variability by Jiann-Shiun Yuan, Springer Singapore
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Jiann-Shiun Yuan ISBN: 9789811008849
Publisher: Springer Singapore Publication: April 13, 2016
Imprint: Springer Language: English
Author: Jiann-Shiun Yuan
ISBN: 9789811008849
Publisher: Springer Singapore
Publication: April 13, 2016
Imprint: Springer
Language: English

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

More books from Springer Singapore

Cover of the book Innovations in Computer Science and Engineering by Jiann-Shiun Yuan
Cover of the book Rethinking Economics by Jiann-Shiun Yuan
Cover of the book Family, Work and Wellbeing in Asia by Jiann-Shiun Yuan
Cover of the book Emergency Response Decision Support System by Jiann-Shiun Yuan
Cover of the book Advanced Computational and Communication Paradigms by Jiann-Shiun Yuan
Cover of the book Pathology of Opportunistic Infections by Jiann-Shiun Yuan
Cover of the book GI Surgery Annual by Jiann-Shiun Yuan
Cover of the book Exploring Sustainable Land Use in Monsoon Asia by Jiann-Shiun Yuan
Cover of the book Theory and Technology of Rock Excavation for Civil Engineering by Jiann-Shiun Yuan
Cover of the book Narratives of Learning Through International Professional Experience by Jiann-Shiun Yuan
Cover of the book Educational Researchers and the Regional University by Jiann-Shiun Yuan
Cover of the book Contemporary Logistics in China by Jiann-Shiun Yuan
Cover of the book Selected Papers from the Asia-Pacific Conference on Economics & Finance (APEF 2016) by Jiann-Shiun Yuan
Cover of the book Agriculturally Important Microbes for Sustainable Agriculture by Jiann-Shiun Yuan
Cover of the book Inequality and Poverty by Jiann-Shiun Yuan
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy