Jiann Shiun Yuan: 1 book

Book cover of CMOS RF Circuit Design for Reliability and Variability
by Jiann-Shiun Yuan
Language: English
Release Date: April 13, 2016

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical...
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