Alain Claverie: 1 book

Book cover of Transmission Electron Microscopy in Micro-nanoelectronics
by Alain Claverie
Language: English
Release Date: January 29, 2013

Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial...
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