Bias Temperature Instability for Devices and Circuits

Nonfiction, Science & Nature, Technology, Electronics, Semiconductors, Circuits
Cover of the book Bias Temperature Instability for Devices and Circuits by , Springer New York
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Author: ISBN: 9781461479093
Publisher: Springer New York Publication: October 22, 2013
Imprint: Springer Language: English
Author:
ISBN: 9781461479093
Publisher: Springer New York
Publication: October 22, 2013
Imprint: Springer
Language: English

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

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