X-Ray Line Profile Analysis in Materials Science
Nonfiction, Science & Nature, Science, Chemistry, Crystallography, Technology, Material Science
| Author: | Jenő Gubicza | ISBN: | 9781466658547 |
| Publisher: | IGI Global | Publication: | March 31, 2014 |
| Imprint: | Engineering Science Reference | Language: | English |
| Author: | Jenő Gubicza |
| ISBN: | 9781466658547 |
| Publisher: | IGI Global |
| Publication: | March 31, 2014 |
| Imprint: | Engineering Science Reference |
| Language: | English |
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
