Trace-Based Post-Silicon Validation for VLSI Circuits

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Advanced Computing, Engineering, Computer Architecture
Cover of the book Trace-Based Post-Silicon Validation for VLSI Circuits by Xiao Liu, Qiang Xu, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Xiao Liu, Qiang Xu ISBN: 9783319005331
Publisher: Springer International Publishing Publication: June 12, 2013
Imprint: Springer Language: English
Author: Xiao Liu, Qiang Xu
ISBN: 9783319005331
Publisher: Springer International Publishing
Publication: June 12, 2013
Imprint: Springer
Language: English

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

More books from Springer International Publishing

Cover of the book Poverty in the United States by Xiao Liu, Qiang Xu
Cover of the book Augmented Communication by Xiao Liu, Qiang Xu
Cover of the book Democracy and an Open-Economy World Order by Xiao Liu, Qiang Xu
Cover of the book Education Tools for Entrepreneurship by Xiao Liu, Qiang Xu
Cover of the book Politics and Bureaucracy in the Norwegian Welfare State by Xiao Liu, Qiang Xu
Cover of the book Chemical Reactor Modeling by Xiao Liu, Qiang Xu
Cover of the book Managing Gastrointestinal Complications of Diabetes by Xiao Liu, Qiang Xu
Cover of the book Crohn's Disease by Xiao Liu, Qiang Xu
Cover of the book Sustainable Risk Management by Xiao Liu, Qiang Xu
Cover of the book Ontology-Based Data Access Leveraging Subjective Reports by Xiao Liu, Qiang Xu
Cover of the book Compromise, Peace and Public Justification by Xiao Liu, Qiang Xu
Cover of the book Foot and Ankle Sports Orthopaedics by Xiao Liu, Qiang Xu
Cover of the book Resource Management for Energy and Spectrum Harvesting Sensor Networks by Xiao Liu, Qiang Xu
Cover of the book Ecological Political Economy and the Socio-Ecological Crisis by Xiao Liu, Qiang Xu
Cover of the book Ultrafast Phenomena XIX by Xiao Liu, Qiang Xu
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy