Spectroscopic Analysis of Optoelectronic Semiconductors

Nonfiction, Science & Nature, Technology, Lasers, Electronics, Semiconductors
Cover of the book Spectroscopic Analysis of Optoelectronic Semiconductors by Juan Jimenez, Jens W. Tomm, Springer International Publishing
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Author: Juan Jimenez, Jens W. Tomm ISBN: 9783319423494
Publisher: Springer International Publishing Publication: August 16, 2016
Imprint: Springer Language: English
Author: Juan Jimenez, Jens W. Tomm
ISBN: 9783319423494
Publisher: Springer International Publishing
Publication: August 16, 2016
Imprint: Springer
Language: English

This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.

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