Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Nonfiction, Science & Nature, Science, Other Sciences, Nanostructures, Technology, Nanotechnology
Cover of the book Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 by , Springer Berlin Heidelberg
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Author: ISBN: 9783642254147
Publisher: Springer Berlin Heidelberg Publication: October 24, 2012
Imprint: Springer Language: English
Author:
ISBN: 9783642254147
Publisher: Springer Berlin Heidelberg
Publication: October 24, 2012
Imprint: Springer
Language: English

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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