Reliability Physics and Engineering

Time-To-Failure Modeling

Nonfiction, Science & Nature, Technology, Quality Control, Electronics, Circuits
Cover of the book Reliability Physics and Engineering by J. W. McPherson, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: J. W. McPherson ISBN: 9783319936833
Publisher: Springer International Publishing Publication: December 20, 2018
Imprint: Springer Language: English
Author: J. W. McPherson
ISBN: 9783319936833
Publisher: Springer International Publishing
Publication: December 20, 2018
Imprint: Springer
Language: English

This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes— all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes— all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.

More books from Springer International Publishing

Cover of the book The Common Bean Genome by J. W. McPherson
Cover of the book Cognitive Abilities and Educational Outcomes by J. W. McPherson
Cover of the book Pediatric Endocrinology by J. W. McPherson
Cover of the book Clinical Guide to Toilet Training Children by J. W. McPherson
Cover of the book Historical Archaeologies of Capitalism by J. W. McPherson
Cover of the book Intimacies of Violence in the Settler Colony by J. W. McPherson
Cover of the book Enterprise and Organizational Modeling and Simulation by J. W. McPherson
Cover of the book Beyond Networks - Interlocutory Coalitions, the European and Global Legal Orders by J. W. McPherson
Cover of the book Internet of Vehicles - Safe and Intelligent Mobility by J. W. McPherson
Cover of the book Measuring and Analysing the Use of Ontologies by J. W. McPherson
Cover of the book Pre-Analytics of Pathological Specimens in Oncology by J. W. McPherson
Cover of the book Capsule Endoscopy by J. W. McPherson
Cover of the book Communicating Climate Change Information for Decision-Making by J. W. McPherson
Cover of the book Metallic Nanostructures by J. W. McPherson
Cover of the book Mixing and Dispersion in Flows Dominated by Rotation and Buoyancy by J. W. McPherson
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy