Reliability Improvement Technology for Power Converters

Nonfiction, Science & Nature, Technology, Machinery, Electronics, Circuits
Cover of the book Reliability Improvement Technology for Power Converters by Kyo-Beum Lee, June-Seok Lee, Springer Singapore
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Kyo-Beum Lee, June-Seok Lee ISBN: 9789811049927
Publisher: Springer Singapore Publication: August 28, 2017
Imprint: Springer Language: English
Author: Kyo-Beum Lee, June-Seok Lee
ISBN: 9789811049927
Publisher: Springer Singapore
Publication: August 28, 2017
Imprint: Springer
Language: English

This book describes how to design circuits in power electronics systems using a reliability approach in three-level topologies, which have many advantages in terms of the current total harmonic distortion and efficiency. Such converter types are increasingly used in large power applications and photovoltaics (PV), therefore research on improvements in the reliability of such systems using multi-level topologies has become important. Four studies for reliability improvement are contained in this book: an open-circuited switch fault detection scheme, tolerance control for an open-circuited switch fault, neutral-point voltage ripple reduction, and leakage current reduction. This book treats not only the topology, but also the fault tolerance and the reduction of the ripples and leakage. This book is aimed at advanced students of electrical engineering and power electronics specialists.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book describes how to design circuits in power electronics systems using a reliability approach in three-level topologies, which have many advantages in terms of the current total harmonic distortion and efficiency. Such converter types are increasingly used in large power applications and photovoltaics (PV), therefore research on improvements in the reliability of such systems using multi-level topologies has become important. Four studies for reliability improvement are contained in this book: an open-circuited switch fault detection scheme, tolerance control for an open-circuited switch fault, neutral-point voltage ripple reduction, and leakage current reduction. This book treats not only the topology, but also the fault tolerance and the reduction of the ripples and leakage. This book is aimed at advanced students of electrical engineering and power electronics specialists.

More books from Springer Singapore

Cover of the book Global Sourcing and Supply Management Excellence in China by Kyo-Beum Lee, June-Seok Lee
Cover of the book Proceedings of the International Congress on Information and Communication Technology by Kyo-Beum Lee, June-Seok Lee
Cover of the book Proteases in Physiology and Pathology by Kyo-Beum Lee, June-Seok Lee
Cover of the book Deep Active Learning by Kyo-Beum Lee, June-Seok Lee
Cover of the book Fungal Nanobionics: Principles and Applications by Kyo-Beum Lee, June-Seok Lee
Cover of the book Cochlear Implantation in Children with Inner Ear Malformation and Cochlear Nerve Deficiency by Kyo-Beum Lee, June-Seok Lee
Cover of the book User Interface Design of Digital Textbooks by Kyo-Beum Lee, June-Seok Lee
Cover of the book Logistical Asia by Kyo-Beum Lee, June-Seok Lee
Cover of the book Ecophysiology, Abiotic Stress Responses and Utilization of Halophytes by Kyo-Beum Lee, June-Seok Lee
Cover of the book System and Architecture by Kyo-Beum Lee, June-Seok Lee
Cover of the book Researching Catholic Education by Kyo-Beum Lee, June-Seok Lee
Cover of the book Novel Polymeric Biochips for Enhanced Detection of Infectious Diseases by Kyo-Beum Lee, June-Seok Lee
Cover of the book Quantifying Resistance by Kyo-Beum Lee, June-Seok Lee
Cover of the book Bio-inspired Computing: Theories and Applications by Kyo-Beum Lee, June-Seok Lee
Cover of the book Urban Wind Environment by Kyo-Beum Lee, June-Seok Lee
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy