Progress in Nanoscale Characterization and Manipulation

Nonfiction, Science & Nature, Science, Other Sciences, Nanostructures, Technology, Material Science
Cover of the book Progress in Nanoscale Characterization and Manipulation by , Springer Singapore
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: ISBN: 9789811304545
Publisher: Springer Singapore Publication: August 30, 2018
Imprint: Springer Language: English
Author:
ISBN: 9789811304545
Publisher: Springer Singapore
Publication: August 30, 2018
Imprint: Springer
Language: English

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.

The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.

The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

More books from Springer Singapore

Cover of the book Building Resilient Neighbourhoods in Singapore by
Cover of the book Biohydrogen Production from Organic Wastes by
Cover of the book Structural Change and Dynamics of Labor Markets in Bangladesh by
Cover of the book Researching and Teaching Second Language Speech Acts in the Chinese Context by
Cover of the book Optically Active Polymers by
Cover of the book Advances in Intelligent Information Hiding and Multimedia Signal Processing by
Cover of the book Using Blended Learning by
Cover of the book Basics of Planning and Management of Patients during Radiation Therapy by
Cover of the book Decision Making with Uncertainty in Stormwater Pollutant Processes by
Cover of the book Analytic Function Theory of Several Variables by
Cover of the book Theory of Practical Cellular Automaton by
Cover of the book Practical Spirituality and Human Development by
Cover of the book Social Life Cycle Assessment by
Cover of the book Community Energy Networks With Storage by
Cover of the book Infrastructure Monitoring with Spaceborne SAR Sensors by
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy