Power-Aware Testing and Test Strategies for Low Power Devices

Nonfiction, Science & Nature, Technology, Electronics, Circuits, Computers, Application Software, CAD/CAM
Cover of the book Power-Aware Testing and Test Strategies for Low Power Devices by , Springer US
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Author: ISBN: 9781441909282
Publisher: Springer US Publication: March 11, 2010
Imprint: Springer Language: English
Author:
ISBN: 9781441909282
Publisher: Springer US
Publication: March 11, 2010
Imprint: Springer
Language: English

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

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Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

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