Author: | Jin Keun Seo, Eung Je Woo | ISBN: | 9781118478158 |
Publisher: | Wiley | Publication: | November 16, 2012 |
Imprint: | Wiley | Language: | English |
Author: | Jin Keun Seo, Eung Je Woo |
ISBN: | 9781118478158 |
Publisher: | Wiley |
Publication: | November 16, 2012 |
Imprint: | Wiley |
Language: | English |
This book provides researchers and engineers in the imaging field with the skills they need to effectively deal with nonlinear inverse problems associated with different imaging modalities, including impedance imaging, optical tomography, elastography, and electrical source imaging. Focusing on numerically implementable methods, the book bridges the gap between theory and applications, helping readers tackle problems in applied mathematics and engineering. Complete, self-contained coverage includes basic concepts, models, computational methods, numerical simulations, examples, and case studies.
Essential reading for Graduate students and researchers in imaging science working across the areas of applied mathematics, biomedical engineering, and electrical engineering and specifically those involved in nonlinear imaging techniques, impedance imaging, optical tomography, elastography, and electrical source imaging
This book provides researchers and engineers in the imaging field with the skills they need to effectively deal with nonlinear inverse problems associated with different imaging modalities, including impedance imaging, optical tomography, elastography, and electrical source imaging. Focusing on numerically implementable methods, the book bridges the gap between theory and applications, helping readers tackle problems in applied mathematics and engineering. Complete, self-contained coverage includes basic concepts, models, computational methods, numerical simulations, examples, and case studies.
Essential reading for Graduate students and researchers in imaging science working across the areas of applied mathematics, biomedical engineering, and electrical engineering and specifically those involved in nonlinear imaging techniques, impedance imaging, optical tomography, elastography, and electrical source imaging