Metal-Dielectric Interfaces in Gigascale Electronics

Thermal and Electrical Stability

Nonfiction, Science & Nature, Technology, Material Science, Electronics
Cover of the book Metal-Dielectric Interfaces in Gigascale Electronics by Ming He, Toh-Ming Lu, Springer New York
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Ming He, Toh-Ming Lu ISBN: 9781461418122
Publisher: Springer New York Publication: February 2, 2012
Imprint: Springer Language: English
Author: Ming He, Toh-Ming Lu
ISBN: 9781461418122
Publisher: Springer New York
Publication: February 2, 2012
Imprint: Springer
Language: English

Metal-dielectric interfaces are ubiquitous in modern electronics. As advanced gigascale electronic devices continue to shrink, the stability of these interfaces is becoming an increasingly important issue that has a profound impact on the operational reliability of these devices. In this book, the authors present the basic science underlying  the thermal and electrical stability of metal-dielectric interfaces and its relationship to the operation of advanced interconnect systems in gigascale electronics. Interface phenomena, including chemical reactions between metals and dielectrics, metallic-atom diffusion, and ion drift, are discussed based on fundamental physical and chemical principles. Schematic diagrams are provided throughout the book to illustrate  interface phenomena and the principles that govern them.

Metal-Dielectric Interfaces in Gigascale Electronics  provides a unifying approach to the diverse and sometimes contradictory test results that are reported in the literature on metal-dielectric interfaces. The goal is to provide readers with a clear account of the relationship between interface science and its applications in interconnect structures. The material presented here will also be of interest to those engaged in field-effect transistor and memristor device research, as well as university researchers and industrial scientists working in the areas of electronic materials processing, semiconductor manufacturing, memory chips, and IC design.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Metal-dielectric interfaces are ubiquitous in modern electronics. As advanced gigascale electronic devices continue to shrink, the stability of these interfaces is becoming an increasingly important issue that has a profound impact on the operational reliability of these devices. In this book, the authors present the basic science underlying  the thermal and electrical stability of metal-dielectric interfaces and its relationship to the operation of advanced interconnect systems in gigascale electronics. Interface phenomena, including chemical reactions between metals and dielectrics, metallic-atom diffusion, and ion drift, are discussed based on fundamental physical and chemical principles. Schematic diagrams are provided throughout the book to illustrate  interface phenomena and the principles that govern them.

Metal-Dielectric Interfaces in Gigascale Electronics  provides a unifying approach to the diverse and sometimes contradictory test results that are reported in the literature on metal-dielectric interfaces. The goal is to provide readers with a clear account of the relationship between interface science and its applications in interconnect structures. The material presented here will also be of interest to those engaged in field-effect transistor and memristor device research, as well as university researchers and industrial scientists working in the areas of electronic materials processing, semiconductor manufacturing, memory chips, and IC design.

More books from Springer New York

Cover of the book Nonelliptic Partial Differential Equations by Ming He, Toh-Ming Lu
Cover of the book Cell-Based Microarrays by Ming He, Toh-Ming Lu
Cover of the book The Effects of Noise on Aquatic Life by Ming He, Toh-Ming Lu
Cover of the book Immunobiology of HLA by Ming He, Toh-Ming Lu
Cover of the book Come On! by Ming He, Toh-Ming Lu
Cover of the book Biometrics and Kansei Engineering by Ming He, Toh-Ming Lu
Cover of the book Practical FDG Imaging by Ming He, Toh-Ming Lu
Cover of the book Detection and Typing Strategies for Pathogenic Escherichia coli by Ming He, Toh-Ming Lu
Cover of the book Correlation-based network analysis of cancer metabolism by Ming He, Toh-Ming Lu
Cover of the book Celiac Disease by Ming He, Toh-Ming Lu
Cover of the book Harmonic Analysis on Symmetric Spaces—Higher Rank Spaces, Positive Definite Matrix Space and Generalizations by Ming He, Toh-Ming Lu
Cover of the book Handbook of Identity Theory and Research by Ming He, Toh-Ming Lu
Cover of the book Global Analysis of Nonlinear Dynamics by Ming He, Toh-Ming Lu
Cover of the book Common Neurosurgical Conditions in the Pediatric Practice by Ming He, Toh-Ming Lu
Cover of the book Advances in Electromagnetic Fields in Living Systems by Ming He, Toh-Ming Lu
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy