Materials Research with Ion Beams

Nonfiction, Science & Nature, Science, Physics, Solid State Physics, Technology, Material Science
Cover of the book Materials Research with Ion Beams by , Springer Berlin Heidelberg
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Author: ISBN: 9783662027943
Publisher: Springer Berlin Heidelberg Publication: June 29, 2013
Imprint: Springer Language: English
Author:
ISBN: 9783662027943
Publisher: Springer Berlin Heidelberg
Publication: June 29, 2013
Imprint: Springer
Language: English

Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.

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Due to new technological progress in the development of ion sources and accelerators interesting kinds of beams are now available. They open new fields for materials research with ion beams. The present status and future possibilities of these research activities are described by experts on this field in the form of review articles. The papers presented in the book focus on very different aspects ranging from the field of truly appliedresearch to the field of fundamental atomic research investigating interaction mechanisms of slow, highly charged particles with surfaces. The book is intended to provide a source of information about recent developments in basic research for the physicists about the status ofthe input of their work into applied materials science. In addition, also other well established techniques, such as Rutherford backscattering analysis and their use in materials research such as of HTC are described. The reader of this book will benefit from its broad view over the various methods of materilas research with ion beams.

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