Interfacial Compatibility in Microelectronics

Moving Away from the Trial and Error Approach

Nonfiction, Science & Nature, Technology, Nanotechnology, Material Science
Cover of the book Interfacial Compatibility in Microelectronics by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen, Springer London
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen ISBN: 9781447124702
Publisher: Springer London Publication: January 10, 2012
Imprint: Springer Language: English
Author: Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
ISBN: 9781447124702
Publisher: Springer London
Publication: January 10, 2012
Imprint: Springer
Language: English

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the “traditional” method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.

In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes:

 solutions to several common reliability issues in microsystem technology,

 methods to understand and predict failure mechanisms at interfaces between dissimilar materials and

 an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA.

Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the “traditional” method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.

In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes:

 solutions to several common reliability issues in microsystem technology,

 methods to understand and predict failure mechanisms at interfaces between dissimilar materials and

 an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA.

Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.

More books from Springer London

Cover of the book Telerehabilitation by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Physical Multiscale Modeling and Numerical Simulation of Electrochemical Devices for Energy Conversion and Storage by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Customer-Driven Supply Chains by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Awareness Systems by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Patient Safety in Surgery by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Explorations in Quantum Computing by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Ultrasound and Endoscopic Surgery in Obstetrics and Gynaecology by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Mitral Valve Surgery by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Solar Lighting by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Multivariate Calculus and Geometry by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Practical Signal and Image Processing in Clinical Cardiology by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Music and Human-Computer Interaction by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Introduction to Computer Graphics by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Structural Properties of Porous Materials and Powders Used in Different Fields of Science and Technology by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
Cover of the book Practical Manual of Interventional Cardiology by Toni T. Mattila, Mervi Paulasto-Kröckel, Tomi Laurila, Vesa Vuorinen, Jorma Kivilahti, Markus Turunen
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy