Ferroelectric Dielectrics Integrated on Silicon

Nonfiction, Science & Nature, Technology, Electronics, Semiconductors
Cover of the book Ferroelectric Dielectrics Integrated on Silicon by , Wiley
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: ISBN: 9781118602805
Publisher: Wiley Publication: February 7, 2013
Imprint: Wiley-ISTE Language: English
Author:
ISBN: 9781118602805
Publisher: Wiley
Publication: February 7, 2013
Imprint: Wiley-ISTE
Language: English

This book describes up-to-date technology applied to high-K materials for More Than Moore applications, i.e. microsystems applied to microelectronics core technologies.
After detailing the basic thermodynamic theory applied to high-K dielectrics thin films including extrinsic effects, this book emphasizes the specificity of thin films. Deposition and patterning technologies are then presented. A whole chapter is dedicated to the major role played in the field by X-Ray Diffraction characterization, and other characterization techniques are also described such as Radio frequency characterization. An in-depth study of the influence of leakage currents is performed together with reliability discussion. Three applicative chapters cover integrated capacitors, variables capacitors and ferroelectric memories. The final chapter deals with a reasonably new research field, multiferroic thin films.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book describes up-to-date technology applied to high-K materials for More Than Moore applications, i.e. microsystems applied to microelectronics core technologies.
After detailing the basic thermodynamic theory applied to high-K dielectrics thin films including extrinsic effects, this book emphasizes the specificity of thin films. Deposition and patterning technologies are then presented. A whole chapter is dedicated to the major role played in the field by X-Ray Diffraction characterization, and other characterization techniques are also described such as Radio frequency characterization. An in-depth study of the influence of leakage currents is performed together with reliability discussion. Three applicative chapters cover integrated capacitors, variables capacitors and ferroelectric memories. The final chapter deals with a reasonably new research field, multiferroic thin films.

More books from Wiley

Cover of the book ABC of Epilepsy by
Cover of the book Nanobiomaterials by
Cover of the book Spaces of Environmental Justice by
Cover of the book Windows 10 At Work For Dummies by
Cover of the book Design and Analysis of Experiments in the Health Sciences by
Cover of the book The Ensemble Practice by
Cover of the book Hydrolysis of Metal Ions by
Cover of the book Europe's Troubled Peace by
Cover of the book Applied Metrology for Manufacturing Engineering by
Cover of the book Biophysics For Dummies by
Cover of the book Investment Theory and Risk Management by
Cover of the book Trading Basics by
Cover of the book The Relationship Inventory by
Cover of the book Movement Equations 3 by
Cover of the book Enhancing Adult Motivation to Learn by
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy