Extreme Statistics in Nanoscale Memory Design

Nonfiction, Science & Nature, Technology, Electronics, Circuits
Cover of the book Extreme Statistics in Nanoscale Memory Design by , Springer US
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: ISBN: 9781441966063
Publisher: Springer US Publication: September 9, 2010
Imprint: Springer Language: English
Author:
ISBN: 9781441966063
Publisher: Springer US
Publication: September 9, 2010
Imprint: Springer
Language: English

Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can ?nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5–6s (0.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can ?nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5–6s (0.

More books from Springer US

Cover of the book Human in Vitro Fertilization and Embryo Transfer by
Cover of the book The Unnoticed Majority in Psychiatric Inpatient Care by
Cover of the book Lectures on Categorical Data Analysis by
Cover of the book The Psychology of War and Peace by
Cover of the book Women’s Health and Menopause by
Cover of the book Architectural Design and CAD by
Cover of the book Reading Complex Words by
Cover of the book Data Mining for Social Network Data by
Cover of the book Psychopharmacology of Aversively Motivated Behavior by
Cover of the book AIDS and Women’s Reproductive Health by
Cover of the book Insects, Experts, and the Insecticide Crisis by
Cover of the book Technological Systems and Industrial Dynamics by
Cover of the book Asian American Mental Health by
Cover of the book Learning in School, Home and Community by
Cover of the book Ethics, The Social Sciences, and Policy Analysis by
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy