Developments in Surface Contamination and Cleaning - Vol 5

Contaminant Removal and Monitoring

Nonfiction, Science & Nature, Technology, Electronics, Science, Physics, General Physics
Cover of the book Developments in Surface Contamination and Cleaning - Vol 5 by Rajiv Kohli, Kashmiri L. Mittal, Elsevier Science
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Author: Rajiv Kohli, Kashmiri L. Mittal ISBN: 9781437778823
Publisher: Elsevier Science Publication: December 31, 2012
Imprint: William Andrew Language: English
Author: Rajiv Kohli, Kashmiri L. Mittal
ISBN: 9781437778823
Publisher: Elsevier Science
Publication: December 31, 2012
Imprint: William Andrew
Language: English

In this series, Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best-practice guidance for scientists and engineers engaged in surface cleaning or dealing with the consequences of surface contamination.

This volume complements Volumes 3 and 4 of this series, which focused largely on particulate contaminants. The expert contributions in this volume cover methods for removal of non-particulate contaminants, such as metallic and non-metallic thin films, hydrocarbons, toxic and hazardous chemicals, and microbiological substances, as well as contamination monitoring in pharmaceutical manufacturing, and an innovative method for characterization at the nanoscale.

  • Comprehensive coverage of innovations in surface contamination and cleaning
  • Written by established experts in the contamination and cleaning field
  • Each chapter is a comprehensive review of the state of the art
  • Case studies included
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In this series, Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best-practice guidance for scientists and engineers engaged in surface cleaning or dealing with the consequences of surface contamination.

This volume complements Volumes 3 and 4 of this series, which focused largely on particulate contaminants. The expert contributions in this volume cover methods for removal of non-particulate contaminants, such as metallic and non-metallic thin films, hydrocarbons, toxic and hazardous chemicals, and microbiological substances, as well as contamination monitoring in pharmaceutical manufacturing, and an innovative method for characterization at the nanoscale.

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