CMOS Test and Evaluation

A Physical Perspective

Nonfiction, Science & Nature, Technology, Electronics, Circuits
Cover of the book CMOS Test and Evaluation by Manjul Bhushan, Mark B. Ketchen, Springer New York
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Author: Manjul Bhushan, Mark B. Ketchen ISBN: 9781493913497
Publisher: Springer New York Publication: December 3, 2014
Imprint: Springer Language: English
Author: Manjul Bhushan, Mark B. Ketchen
ISBN: 9781493913497
Publisher: Springer New York
Publication: December 3, 2014
Imprint: Springer
Language: English

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

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