Charge-Trapping Non-Volatile Memories
Volume 2--Emerging Materials and Structures
Nonfiction, Science & Nature, Technology, Nanotechnology, Electronics, Circuits
| Author: | ISBN: | 9783319487052 | |
| Publisher: | Springer International Publishing | Publication: | February 14, 2017 |
| Imprint: | Springer | Language: | English |
| Author: | |
| ISBN: | 9783319487052 |
| Publisher: | Springer International Publishing |
| Publication: | February 14, 2017 |
| Imprint: | Springer |
| Language: | English |
This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced.
-
Provides a comprehensive overview of the technology for charge-trapping non-volatile memories;
-
Details new architectures and current modeling concepts for non-volatile memory devices;
-
Focuses on conduction through multi-layer gate dielectrics stacks.
This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced.
-
Provides a comprehensive overview of the technology for charge-trapping non-volatile memories;
-
Details new architectures and current modeling concepts for non-volatile memory devices;
-
Focuses on conduction through multi-layer gate dielectrics stacks.
