Zhenghao Gan: 2 books
by Zhenghao Gan, Waisum Wong, Juin J. Liou
Language: English
Release Date: October 6, 2012
Language: English
Release Date: October 6, 2012
Proven processes for ensuring semiconductor device reliability
Co-written by experts in the field, Semiconductor Process Reliability in Practice contains detailed descriptions and analyses of reliability and qualification for semiconductor device manufacturing and discusses the underlying physics...
by Cher Ming Tan, Wei Li, Zhenghao Gan
Language: English
Release Date: March 28, 2011
Language: English
Release Date: March 28, 2011
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues...