Paul F Fewster: 1 book

Book cover of X-Ray Scattering from Semiconductors and Other Materials
by Paul F Fewster
Language: English
Release Date: February 12, 2015

This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that...
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