by
Sleiman Bou-Sleiman, Mohammed Ismail
Language: English
Release Date: September 23, 2011
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing,...