Robust Design of Electronics and Systems
by
Kirk A. Gray, John J. Paschkewitz
Language: English
Release Date: March 11, 2016
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-based...