Eran Gur: 1 book
by Zeev Zalevsky, Pavel Livshits, Eran Gur
Language: English
Release Date: November 13, 2013
Language: English
Release Date: November 13, 2013
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures.
Engineers and scientists face the pressing problem in ULSI development and quality...
