Electronics category: 3783 books

Cover of Introduction to Quantum Metrology

Introduction to Quantum Metrology

The Revised SI System and Quantum Standards

by Waldemar Nawrocki
Language: English
Release Date: May 30, 2019

This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass,...
Cover of Embedded Systems Handbook

Embedded Systems Handbook

Embedded Systems Design and Verification

by
Language: English
Release Date: September 3, 2018

Considered a standard industry resource, the Embedded Systems Handbook provided researchers and technicians with the authoritative information needed to launch a wealth of diverse applications, including those in automotive electronics, industrial automated systems, and building automation and control....
Cover of Silicon-On-Insulator (SOI) Technology

Silicon-On-Insulator (SOI) Technology

Manufacture and Applications

by O. Kononchuk, B.-Y. Nguyen
Language: English
Release Date: June 19, 2014

Silicon-On-Insulator (SOI) Technology: Manufacture and Applications covers SOI transistors and circuits, manufacture, and reliability. The book also looks at applications such as memory, power devices, and photonics. The book is divided into two parts; part one covers SOI materials and manufacture,...
Cover of Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Electron Emission Physics

by Kevin Jensen, Peter W. Hawkes
Language: English
Release Date: November 26, 2007

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
Cover of Compound Semiconductors

Compound Semiconductors

Physics, Technology, and Device Concepts

by
Language: English
Release Date: October 6, 2017

This book provides an overview of compound semiconductor materials and their technology. After presenting a theoretical background, it describes the relevant material preparation technologies for bulk and thin-layer epitaxial growth. It then briefly discusses the electrical, optical, and structural...
Cover of Advances in Imaging and Electron Physics
by
Language: English
Release Date: May 9, 2019

Advances in Imaging and Electron Physics, Volume 210, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle...
Cover of Advances in Imaging and Electron Physics
by Peter W. Hawkes
Language: English
Release Date: August 25, 2017

Advances in Imaging and Electron Physics, Volume 202, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle...
Cover of Advances in Imaging and Electron Physics
by Peter W. Hawkes
Language: English
Release Date: July 29, 2011

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
Cover of Advances in Imaging and Electron Physics
by Peter W. Hawkes
Language: English
Release Date: July 17, 2018

Advances in Imaging and Electron Physics, Volume 207, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle...
Cover of Advances in Imaging and Electron Physics
by
Language: English
Release Date: July 5, 2001

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
Cover of Advances in Imaging and Electron Physics
by Peter W. Hawkes, Martin Hÿtch
Language: English
Release Date: February 16, 2019

Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle...
Cover of Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Dogma of the Continuum and the Calculus of Finite Differences in Quantum Physics

by Beate Meffert, Henning Harmuth, Peter W. Hawkes
Language: English
Release Date: December 12, 2005

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
Cover of Advances in Imaging and Electron Physics
by Peter W. Hawkes
Language: English
Release Date: October 16, 2018

Advances in Imaging and Electron Physics, Volume 208, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle...
Cover of Advances in Imaging and Electron Physics
by Peter W. Hawkes
Language: English
Release Date: October 24, 2017

Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle...
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