Microscopes category: 63 books

Cover of Introduction to Practical Ore Microscopy
by P.R. Ineson
Language: English
Release Date: June 6, 2014

First published in 1989. Routledge is an imprint of Taylor & Francis, an informa company.
Cover of Microscopie
by Encyclopaedia Universalis, Les Grands Articles
Language: French
Release Date: October 28, 2015

La révolution qui consiste, à la fin du XVIe siècle, à regarder « à la loupe » non plus directement un objet, mais son image agrandie est à l'origine de la microscopie. L'étymologie (du grec mikros, petit, et skopein, examiner) renvoie à l'examen d'objets ou de détails d'objets à peine perceptibles...
Cover of Quantitative Data Processing in Scanning Probe Microscopy
by Petr Klapetek
Language: English
Release Date: December 31, 2012

Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture...
Cover of Ultrafast Dynamics in Molecules, Nanostructures and Interfaces
by G G Gurzadyan, G Lanzani, C Soci;T C Sum
Language: English
Release Date: January 22, 2014

Primary events in natural systems or devices occur on extremely short time scales, and yet determine in many cases the final performance or output. For this reason research in ultrafast science is of primary importance and impact in both fundamental research as well as its applications. This book...
Cover of Diagnostic Electron Microscopy

Diagnostic Electron Microscopy

A Practical Guide to Interpretation and Technique

by
Language: English
Release Date: November 9, 2012

Diagnostic Electron Microscopy Diagnostic Electron Microscopy: A Practical Guide to Interpretation and Technique summarises the current interpretational applications of TEM in diagnostic pathology. This concise and accessible volume provides a working guide to the main, or most useful, applications...
Cover of Integrated Vector Management

Integrated Vector Management

Controlling Vectors of Malaria and Other Insect Vector Borne Diseases

by Graham Matthews
Language: English
Release Date: August 17, 2011

Diseases transmitted by insects continue to have a major impact on human populations. Malaria, dengue, onchocerciasis, sleeping sickness and leishmaniasis all adversely affect man. Malaria is one of the most important causes of child mortality and reduces economic development in many countries, with...
Cover of Advances in Imaging and Electron Physics
by Peter W. Hawkes
Language: English
Release Date: October 14, 2016

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
Cover of Insect Microscopy
by Andrew Chick
Language: English
Release Date: August 31, 2016

Insects, and their close relatives, the arachnids, centipedes, millipedes and woodlice, make ideal material for study by the recreational microscopist. Moreover for the entomologist, the addition of the use of the microscope to their tool kit adds a whole new dimension to their study, revealing in...
Cover of Super-Resolution Microscopy

Super-Resolution Microscopy

A Practical Guide

by Udo J. Birk
Language: English
Release Date: September 12, 2017

This unique book on super-resolution microscopy techniques presents comparative, in-depth analyses of the strengths and weaknesses of the individual approaches. It was written for non-experts who need to understand the principles of super-resolution or who wish to use recently commercialized instruments...
Cover of Advances in Imaging and Electron Physics
by Peter W. Hawkes
Language: English
Release Date: April 18, 2015

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
Cover of Strain and Dislocation Gradients from Diffraction

Strain and Dislocation Gradients from Diffraction

Spatially-Resolved Local Structure and Defects

by Rozaliya Barabash, Gene Ice
Language: English
Release Date: March 20, 2014

This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand...
Cover of Standard and Super-Resolution Bioimaging Data Analysis
by
Language: English
Release Date: October 12, 2017

A comprehensive guide to the art and science of bioimaging data acquisition, processing and analysis Standard and Super-Resolution Bioimaging Data Analysis gets newcomers to bioimage data analysis quickly up to speed on the mathematics, statistics, computing hardware and acquisition technologies...
Cover of Digital Microscopy

Digital Microscopy

A second edition of "Video Microscopy"

by Greenfield Sluder, David E. Wolf
Language: English
Release Date: December 18, 2003

This updated second edition of the popular methods book "Video Microscopy" shows how to track dynamic changes in the structure or architecture of living cells and in reconstituted preparations using video and digital imaging microscopy. Contains 10 new chapters addressing developments over the last...
Cover of Atomic Force Microscopy

Atomic Force Microscopy

Understanding Basic Modes and Advanced Applications

by Greg Haugstad
Language: English
Release Date: September 4, 2012

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical...
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