Atomic Force Microscopy

Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Nanotechnology
Cover of the book Atomic Force Microscopy by Bert Voigtländer, Springer International Publishing
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Author: Bert Voigtländer ISBN: 9783030136543
Publisher: Springer International Publishing Publication: May 23, 2019
Imprint: Springer Language: English
Author: Bert Voigtländer
ISBN: 9783030136543
Publisher: Springer International Publishing
Publication: May 23, 2019
Imprint: Springer
Language: English

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

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This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

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