Advances in Imaging and Electron Physics

Nonfiction, Science & Nature, Technology, Optics, Engineering, Computers, General Computing
Cover of the book Advances in Imaging and Electron Physics by Peter W. Hawkes, Elsevier Science
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Author: Peter W. Hawkes ISBN: 9780080569123
Publisher: Elsevier Science Publication: September 6, 2011
Imprint: Academic Press Language: English
Author: Peter W. Hawkes
ISBN: 9780080569123
Publisher: Elsevier Science
Publication: September 6, 2011
Imprint: Academic Press
Language: English

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as “Academic Press, 1994” (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, ‘Computer Techniques for Image Processing in Electron Microscopy’, Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing.

* Updated with contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor has brought together leaders of some of the main themes of past and hopefully of future volumes: electron microscopy, since Ladislaus Marton was one of the pioneers; mathematical morphology, which has often appeared in this series and also fills a supplement, so often cited that it usually appears just as “Academic Press, 1994” (H.J.A.M. Heijmans, Morphological Image Operators, Supplement 25, 1994) with no mention of the Advances; ptychography, a highly original approach to the phase problem, the latter also the subject of a much cited Supplement (W.O. Saxton, ‘Computer Techniques for Image Processing in Electron Microscopy’, Supplement 10, 1978); and wavelets, which have become a subject in their own right, not just a tool in image processing.

* Updated with contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

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