Author: | Jay Theodore Cremer, Jr. | ISBN: | 9780123972767 |
Publisher: | Elsevier Science | Publication: | December 31, 2012 |
Imprint: | Academic Press | Language: | English |
Author: | Jay Theodore Cremer, Jr. |
ISBN: | 9780123972767 |
Publisher: | Elsevier Science |
Publication: | December 31, 2012 |
Imprint: | Academic Press |
Language: | English |
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.