Aberration-Corrected Imaging in Transmission Electron Microscopy

An Introduction

Nonfiction, Science & Nature, Science, Physics, Optics, Technology, Material Science
Cover of the book Aberration-Corrected Imaging in Transmission Electron Microscopy by Rolf Erni, World Scientific Publishing Company
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Rolf Erni ISBN: 9781783265305
Publisher: World Scientific Publishing Company Publication: March 23, 2015
Imprint: ICP Language: English
Author: Rolf Erni
ISBN: 9781783265305
Publisher: World Scientific Publishing Company
Publication: March 23, 2015
Imprint: ICP
Language: English

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.

This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Contents:

  • Introduction

  • Fundamentals:

  • High-Resolution Transmission Electron Microscopy

    Scanning Transmission Electron Microscopy

    Limits of Conventional Atomic-Resolution Electron Microscopy

  • Electron Optics:

  • Basic Principles of Electron Optics

    Gaussian Dioptrics

  • Aberration Correction:

  • Aberrations

    Aberration Correctors

    Aberration-Corrected Imaging

Readership: Advanced undergraduate and graduate students in materials science and related fields.
Key Features:

  • Uniform notation and concept throughout the book
  • Comprehensive but concise: covers the basics of the imaging modes, electron optics and aberration correction
  • Contains tables and equations that often need to be looked up, but cannot be found in a single source
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.

This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Contents:

Readership: Advanced undergraduate and graduate students in materials science and related fields.
Key Features:

More books from World Scientific Publishing Company

Cover of the book Biomimetic Robotic Artificial Muscles by Rolf Erni
Cover of the book Structural Aspects of Quantum Field Theory and Noncommutative Geometry by Rolf Erni
Cover of the book Statistical Data Fusion by Rolf Erni
Cover of the book Corruption, Good Governance and Economic Development by Rolf Erni
Cover of the book Interface Between Quantum Information and Statistical Physics by Rolf Erni
Cover of the book Entrepreneurship and Economic Growth in China by Rolf Erni
Cover of the book International Contracting by Rolf Erni
Cover of the book Selforganizology by Rolf Erni
Cover of the book Smoothed Point Interpolation Methods by Rolf Erni
Cover of the book Computational Intelligence and Its Applications by Rolf Erni
Cover of the book Phase Transitions by Rolf Erni
Cover of the book The Imperial College Lectures in Petroleum Engineering by Rolf Erni
Cover of the book Forward Engagement by Rolf Erni
Cover of the book Elementary Particles by Rolf Erni
Cover of the book Liquid Crystals with Nano and Microparticles by Rolf Erni
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy